COMPLYING WITH LATEST STANDARDS
Having at our disposal sophisticated equipment and experienced staff, our laboratory offers possibilities of research complying with latest standards compatible with proper directives and suitable relative standards:
DEVICE CONTROL ACCORDING TO EMC DIRECTIVE
EMC EMISSION TEST OF LOW POWER ELECTRONIC DEVICES (PHASE CURRENT OF THE RECEIVER <16 A) POWERED FROM POWER GRID 230V:
- Carrying out pre-compliance tests in the area of device interference
- To a limited extent - radiated interference measurements
- Testing harmonic emissions of current in electronic devices
EMC IMMUNITY TEST OF LOW POWER DEVICES (PHASE CURRENT OF THE RECEIVER <16 A) POWERED FROM POWER GRID 230V:
- Fast transient burst
- Surge
- Dynamic changes of PQT power voltage
LVD DIRECTIBE DEVICE TESTING
- Basic electrical safety tests of devices powered from electrical grid 230V, for 1 2 safety devices (dielectric resistance, insulation resistance, protective circuit testing)
- Environment tests
- Electrical tests
LIGHT SOURCE PARAMETER TESTS, INCLUDING FOLLOWING VALUES:
- Spectral intensity and decomposition
- Colour temperature
- CRI indicator
- which are extremely important in specialist uses of light sources, i.e. in medicine, plygraphy, spraying, and cosmetology, etc.
DESIGNING RELIABLE ELECTRONIC DEVICES WITHIN CONGENERIC DEVICE DESIGN (R&D)
- Device reliability tests in adverse weather conditions (temperature, power voltage, humidity)
- Tests in extreme weather conditions (temperature, power voltage, humidity) enabling to find “weak points” in a device
- Ready-made reliability test programmes for particular product groups based on many years` experience resulting from construction, tests, service and information collected from our clients
- Highly Accelerated Life Test (HALT)
- Highly Accelerated Stress Screen (HASS)